| What type or types of AFM Applications do you use? Topography Material Sensitive Contrast Phase Imaging Force Modulation Chemical Force Microscopy Later Force Microscopy Force-Curve Analysis Electrical Properties using Two-pass Techniques *Lift Mode Electrical Force Microscopy Surface Potential Imaging - Kelvin Probe Voltage Modulation Scanning Gate Microscopy Scanning Impedance Microscopy Electrical Properties using Contact Techniques Scanning Capacitance Microscopy Piezoresponse Force Microscopy Scanning Spreading Resistance Microscopy Electrostatic Surface Modification Magnetic Force Microscopy Magnetoresistive Sensitivity Mapping Magnetic Dissipation Microscopy |