CCHAR

Carbon Design Innovations’ (CDI) carbon core high-aspect ratio probes (CCHAR) for atomic force microscopy (AFM) start with a core carbon nanotube (CNT) that is further processed and stabilized with patented technology resulting in a CNT probe with maximum aspect ratio, resolution, imaging lifetime and stability.

The CCHAR high-aspect ratio CNT AFM probes, are designed for critical dimension measurements and imaging high-Z structures in materials science, metrology and life science applications. The standard CNT probe length is approximately 1μm overall with < 500nm of exposed CNT tip. These two dimensions can also be custom engineered to user specifications.

• Stabilized, robust CNT probe with maximized aspect ratio
• High-resolution CNT tip with the convenience of a silicon cantilever
• Enables imaging of critical dimension trench or hole structures with high-Z dimension variation
• Longer lifetime allows users compare samples with the same probe with no loss of resolution
• Reduced breakage, wear and contamination
• Precise length, diameter and angle deliver consistent probe-to-probe results
  

• Overall CNT length: 1μm, Exposed CNT length: <500nm
• Proprietary stabilization coatings
• Imaging lifetime >10x that of silicon probes
• Custom length, aspect ratio and angles available
• Available on any cantilever of your choice.
  
  

• CNT diameter is nominally 25nm
• Effective radius of curvature nominally 10nm (unsharpened)
• Aspect Ratio > 10:1
• Angular Displacement nominally 0o
• Variable spring constants available
  
  

• Critical dimension measurement
• Metrology
• Force modulation microscopy
  
  

CDI’s high-aspect ratio probes are widely applicable for most non-contact (tapping) mode AFM applications. Proprietary coatings and other custom processes are available.

Talk to us about customizing a tip set for your specialized application.