CCHR

Carbon Design Innovations’ (CDI) carbon core high-resolution probes (CCHR) for atomic force microscopy (AFM) start with a core carbon nanotube (CNT) that is straightened and stabilized with CDI’s patented manufacturing processes. The result is a CNT probe with maximum resolution, imaging lifetime and stability.

The CCHR high-resolution CNT AFM probes are designed for detailed imaging in metrology and materials science applications. The standard CNT probe length is 500nm, with the exposed CNT tip <200nm.

• Stabilized, robust CNT probe on a standard cantilever
• High-resolution CNT tip with the convenience of a silicon cantilever
• Longer lifetime allows users compare samples with the same probe with no loss of resolution
• Reduced breakage, wear and contamination
• Precise length, diameter and angle deliver consistent probe-to-probe results
  

• Overall CNT length: <500nm, Exposed CNT length: < 200nm
• Proprietary stabilization coatings
• Imaging lifetime >10x that of silicon probes
• Available on any cantilever of your choice.
  
  

• CNT diameter nominally 20nm
• Effective radius of curvature nominally 5nm (unsharpened)
• Aspect Ratio > 5:1
• Angular Displacement nominally 0o
• Variable spring constants available
  
  

• Surface Roughness
• Scanning Conductance Microscopy
• Force modulation
  
  

CDI’s high-aspect ratio probes are widely applicable for most non-contact (tapping) mode AFM applications. Proprietary coatings and other custom processes are available.

Talk to us about customizing a tip set for your specialized application.