NN-T75-HAR10 (10 Tips)
Details
10 Needleprobes AFM probe for Electrostatic Force Mode (EFM)
A long, metallic AgGa nanoneedle with a constant diameter. HAR-NP can be grown on different substrates including AFM tipped and tipless cantilever ,STM probes, quartz tuning forks, etc. HAR-NP can be grown with various arrangements (e.g. parallel, semi-parallel and perpendicular to the AFM cantilever)
| Cantilever Specification | ||||||
| Resonant frequency kHz |
62 | Force constant N/m | 3 | Cantilever Length (µm) | 225 | |
| Needle Length | 10 µm | |||||
| Needle Diameter | 50 nm | |||||
| Needle Angle | 12° | |||||
| Specifications | |||
| Technical Data | Typical | Range | |
| Force Constant | 3.0 N/m | 1.2 - 6.4 N/m | |
| Resonance Freq. | 62 kHz | 47 - 76 kHz | |
| Cantilever Length | 225 µm | 215 - 235 µm | |
| Cantilever Mean Width | 30 µm | 25 - 35 µm | |
| Cantilever Thickness | 3.0 µm | 2.5 - 3.5 µm | |
| Cantilever Shape Cross-section |
Rectangular / Trapezoidal | ||
| Number of Cantilevers | 1 per chip | Tip Height | 14 µm ( not including needle ) | Tip Offset | 15 - 25 µm |
| Needle Material | Ag2Ga | ||
| Cantilever and Chip Material | Single Crystal Silicon | ||
| Chip Size (industry standard) |
3400 µm (L) x 1600 µm (W) x 300 µm (T) | ||
| Coating | Aluminum reflex (on non-tip side) | ||
| Main characteristics: |
- Electrically conductive
- High aspect ratio tip
- 1 to 100 µm in length
- 50 to 500 nm in diameter
- Various substrate (e.g. Tuning fork, STM probe, AFM cantilever)
- Various arrangements (e.g. parallel and semi-parallel to AFM cantilevers)
| Application: |
- Cell probing,
- Liquid property measurements,
- Conductive AFM
| Advantages: |
- Simple and Useful Geometry
- Easier to Use and Interpret the Results
- Electrically Conductive
- Versatility for More Complex Applications
- Price advantage
- Robust and Long Lasting
- High Performance
* Custom angles and lengths are available - contact us for details.
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