Standard AFM Probes
NT-MDT supply with high resolution SPM probes for the main SPM modes.
The probes are supplied with and without reflective coating, with conductive and magnetic coatings to cover the greater part of SPM application range.
Extremely sharp tips allow to obtain high-quality images of your samples. Probes have standard chip size that makes them compartible with the devices of the most SPM manufactures.
The probes are supplied with and without reflective coating, with conductive and magnetic coatings to cover the greater part of SPM application range.
Extremely sharp tips allow to obtain high-quality images of your samples. Probes have standard chip size that makes them compartible with the devices of the most SPM manufactures.
| Contact Probes |
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AFM probes for CONTACT modes. Can be supplied with Au or Al reflective coating, without tips, bare, with conductive coating. |
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| Noncontact/Semicontact Probes |
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AFM probes for Noncontact/Semicontact Modes with wide range of resonant frequencies and force constants. |
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| Force Modulation Probes |
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AFM probes for Force Modulation Mode. Can be supplied with Au or Al reflective coating, without tips, bare, with conductive or magnetic coating. |
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| Conductive probes |
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AFM probes for Conductive modes (SCM, SKM, SRI, EFM, I-V curve spectroscopy, voltage lithography) with TiN, PtIr or Au conductive coating. |
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| Magnetic Probes |
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AFM probes for Magnetic mode (MFM) with CoCr magnetic coating. |
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| Tipless probes |
| Noncontact/Semicontact and Contact AFM probes without tips. |
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- Contact Probes (CSG) (43)
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- Tipless Probes (18)
